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The Neural-Network Approach to Recognize Defect Pattern in LED Manufacturing
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  • The Neural-Network Approach to Recognize Defect Pattern in LED Manufacturing
  • The Neural-Network Approach to Recognize Defect Pattern in LED Manufacturing
저자명
Chen. Wen-Chin,Tsai. Chih-Hung,Hsu. Shou-Wen
간행물명
The Asian journal on quality
권/호정보
2006년|7권 3호|pp.58-69 (12 pages)
발행정보
한국품질경영학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

This paper presents neural network-based recognition system for automatic light emitting diode (LED) inspection. The back-propagation neural network (BPNN) is proposed and tested. The current-voltage (I-V) characteristic data of LED from the inspection process is used for the network training and testing. This study selects 300 random samples as network training and employs 100 samples as network testing. The experimental results show that if the classification work is done well, the accuracy of recognition is 100%, and the testing speed of the proposed recognition system is almost one half faster than the traditional inspection system does. The proposed neural-network approach is successfully demonstrated by real data sets and can be effectively developed as a recognition system for a practical application purpose.