- The Neural-Network Approach to Recognize Defect Pattern in LED Manufacturing
- The Neural-Network Approach to Recognize Defect Pattern in LED Manufacturing
- ㆍ 저자명
- Chen. Wen-Chin,Tsai. Chih-Hung,Hsu. Shou-Wen
- ㆍ 간행물명
- The Asian journal on quality
- ㆍ 권/호정보
- 2006년|7권 3호|pp.58-69 (12 pages)
- ㆍ 발행정보
- 한국품질경영학회
- ㆍ 파일정보
- 정기간행물|ENG| PDF텍스트
- ㆍ 주제분야
- 기타
