Combinations of visible and near-infrared (NIR) bands in an image are widely used for estimating vegetation vigor and productivity. Using this approach to understand within-field grain crop variability could allow pre-harvest estimates of yield, and might enable mapping of yield variations without use of a combine yield monitor. The objective of this study was to estimate within-field variations in crop yield using vegetation indices derived from hyperspectral images. Hyperspectral images were acquired using an aerial sensor on multiple dates during the 2003 and 2004 cropping seasons for corn and soybean fields in central Missouri. Vegetation indices, including intensity normalized red (NR), intensity normalized green (NG), normalized difference vegetation index (NDVI), green NDVI (gNDVI), and soil-adjusted vegetation index (SAVI), were derived from the images using wavelengths from 440 nm to 850 nm, with bands selected using an iterative procedure. Accuracy of yield estimation models based on these vegetation indices was assessed by comparison with combine yield monitor data. In 2003, late-season NG provided the best estimation of both corn $(r^2;=;0.632)$ and soybean $(r^2;=;0.467)$ yields. Stepwise multiple linear regression using multiple hyperspectral bands was also used to estimate yield, and explained similar amounts of yield variation. Corn yield variability was better modeled than was soybean yield variability. Remote sensing was better able to estimate yields in the 2003 season when crop growth was limited by water availability, especially on drought-prone portions of the fields. In 2004, when timely rains during the growing season provided adequate moisture across entire fields and yield variability was less, remote sensing estimates of yield were much poorer $(r^2<0.3)$.