Finite failure NHPP models presented in the literature exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. Accurate predictions of software release times, and estimation of the reliability and availability of a software product require quantification of a critical element of the software testing process : test coverage. This model called enhanced non-homogeneous poission process(ENHPP). In this paper, exponential coverage and S-coverage model was reviewed, proposes the exponentiated exponential coverage reliability model, which maked out efficiency substituted for gamma and Weibull model(2 parameter shape illustrated by Gupta and Kundu(2001). In this analysis of software failure data, algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on SSE statistics for the sake of efficient model, was employed.