Spectroscopic ellipsometry is an excellent technique for determining dielectric function. To obtain critical point energy, standard analytic critical point expression is used conventionally for second derivatives of dielectric function which might increase high frequency noise than signal. However, reciprocal-space analysis offers several advantages for determining critical point parameters in optical and other spectra, for example the separation of baseline, information, and high frequency noise in low-, medium-, high-index Fourier coefficient, respectively. We used reciprocal Fourier analysis for removing noise and determining critical point of ZnCdSe alloy.