The critical current, $I_c$, degradation behaviors with bending strain were investigated in a commercially available YBCO coated conductor tape. In particular, the strain reversibility of $I_c$ and the influence of repeated bending on $I_c$ have been studied. Also, repeated bending at 77 K was done in order to understand the Ie behavior under cyclic bending strains. A reversible behavior of $I_c$ has been found up to a high bending strain of 1.60% for the RABiTS/MOD processed CC sample with copper reinforcement. Under repeated bending, the Ie showed a 95% $I_c$ retention up to 100 cycles for bending strains of 1.0% or less. The n-value behavior showed a good agreement with the $I_c$ degradation behavior, representing that any cracking did not occur on the YBCO film resulting from the reinforcement provided by the copper stabilizers.