- 실험계획법을 적용한 웨이퍼 폴리싱의 최적 조건 선정에 관한 연구
- ㆍ 저자명
- 원종구,이정훈,이정택,이은상,Won. Jong-Koo,Lee. Jung-Hun,Lee. Jung-Taik,Lee. Eun-Sang
- ㆍ 간행물명
- 한국공작기계학회논문집
- ㆍ 권/호정보
- 2008년|17권 1호|pp.21-28 (8 pages)
- ㆍ 발행정보
- 한국공작기계학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
The final polishing process is based on slurry, pad, conditioner, equipment. Therefore, the concept of wafer final polishing is also necessary for repeatability of results between polished wafers. In this study, the machining conditions have a pressure, table speed, machining time and slurry ratio. This research investigated the surface characteristics that apply variable machining conditions and response surface methodology was used to obtain more flexible and optimumal condition base on Taguchi method. On the base of estimated response surface curvature from the equation and results of Taguchi method, combined design of experiment was considered to lead to optimumal condition. Finally, polished wafer was obtained mirror like surface.