- Si 기판에 제작된 AAO 박막의 기공 형성 최적화에 관한 연구
- ㆍ 저자명
- 권순일,양계준,송우창,이재형,임동건,Kwon. Soon-Il,Yang. Kea-Joon,Song. Woo-Chang,Lee. Jae-Hyeong,Lim. Dong-Gun
- ㆍ 간행물명
- 전기전자재료학회논문지
- ㆍ 권/호정보
- 2008년|21권 5호|pp.415-420 (6 pages)
- ㆍ 발행정보
- 한국전기전자재료학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
AAO films were fabricated on two kinds of substrates such as $Al/SiO_2/Si$ and Al/Ni/Ti/Si. To obtain well-aligned AAO film, we optimized process condition for buffer layer, electrolyte and voltage. In the case of oxalic acid, the AAO film with pore size of approximately 45 nm was obtained at voltage of 40 V, temperature of $10^{circ}C$, oxalic acid of 0.3 M and widening time of 60 min. Then the thickness of barrier is less than 600 nm. In the case of sulfuric acid, the AAO film has pore size of 40 nm and barrier thickness of 400 nm with optimum conditions such as voltage of 25 V, temperature of $8^{circ}C$, sulfuric acid of 0.3 M and widening time of 60 min.