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The Method of Determining Stress Levels Regarding the Electrical ALT through Optical Temperature Sensor
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  • The Method of Determining Stress Levels Regarding the Electrical ALT through Optical Temperature Sensor
  • The Method of Determining Stress Levels Regarding the Electrical ALT through Optical Temperature Sensor
저자명
Ryu. Haeng-Soo,Han. Gyu-Hwan,Yoon. Nam-Sik
간행물명
Journal of electrical engineering & technology
권/호정보
2008년|3권 2호|pp.184-191 (8 pages)
발행정보
대한전기학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Electrical endurance is the critical characteristic of Magnetic contactors(MCs), which are widely used in such power equipment as elevators, cranes, and factory control rooms in order to close and open control circuits. Testing time, however, is not short in typical cases in which some method of reducing the testing period is required. This study shows the method of determining the stress level of electrical ALT(Accelerated Life Test) through optical temperature sensor and the relationship between 0.05 s and 0.1 s for on-time. The tool used for analyzing the test result is MINITAB. I will propose the method of determining the optimized stress level through optical temperature sensor, which will contribute to minimize the testing time and development period and also raise the product reliability.