In this paper describes the process of designing a protection circuit against an open or short electronic ballast. An open electronic ballast creates high voltages in a regular period, which a lies voltage stress on switching devices. On the other hand, a shorted output generates excessive current, causing problems such as heat generation in the ballast and reduced lifespan of semiconductor devices. This study proposes a protection circuit consisting of TTL and passive devices to resolve the problems. The proposed protection circuit offers the benefits of low cost and high reliability. The proposed circuit was connected to an actual ballast to demonstrate its applicability.