- 저온 나노임프린트 공정에서 압력과 폴리머 레지스트 초기 두께의 영향
- ㆍ 저자명
- 김남웅,김국원,신효철,Kim. Nam-Woong,Kim. Kug-Weon,Sin. Hyo-Chol
- ㆍ 간행물명
- 한국공작기계학회논문집
- ㆍ 권/호정보
- 2009년|18권 1호|pp.68-75 (8 pages)
- ㆍ 발행정보
- 한국공작기계학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
A major disadvantage of thermal nanoimprint lithography(NIL) is the thermal cycle, that is, heating over glass transition temperature and then cooling below it, which requires a significant amount of processing time and limits the throughput. One of the methods to overcome this disadvantage is to make the processing temperature lower Accordingly, it is necessary to determine the effects on the processing parameters for thermal NIL at reduced temperatures and to optimize the parameters. This starts with a clear understanding of polymer material behavior during the NIL process. In this work, the squeezing and filling of thin polymer films into nanocavities during the low temperature thermal NIL have been investigated based upon a two-dimensional viscoelastic finite element analysis in order to understand how the process conditions affect a pattern quality; Pressure and initial polymer resist thickness dependency of cavity filling behaviors has been investigated.