- 웨이블릿 다해상도 분석에 의한 디지털 이미지 결점 검출 알고리즘
- ㆍ 저자명
- 김경준,이창환,김주용,Kim. Kyung-Joon,Lee. Chang-Hwan,Kim. Joo-Yong
- ㆍ 간행물명
- 韓國染色加工學會誌
- ㆍ 권/호정보
- 2009년|21권 1호|pp.53-58 (6 pages)
- ㆍ 발행정보
- 한국염색가공학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
A real-time inspection system has been developed by combining CCD based image processing algorithm and a standard lighting equipment. The system was tested for defective fabrics showing nozzle contact scratch marks, which were one of the frequently occurring defects. Multi-resolution analysis(MRA) algorithm were used and evaluated according to both their processing time and detection rate. Standard value for defective inspection was the mean of the non-defect image feature. Similarity was decided via comparing standard value with sample image feature value. Totally, we achieved defective inspection accuracy above 95%.