- 반도체 패키지의 층간박리 파괴역학인자 해석 및 균열진전경로 예측
- ㆍ 저자명
- 정남용,박철희,Chung. Nam-Yong,Park. Cheol-Hee
- ㆍ 간행물명
- 한국공작기계학회지
- ㆍ 권/호정보
- 2009년|18권 4호|pp.401-409 (9 pages)
- ㆍ 발행정보
- 한국공작기계학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
This paper presents a method of calculating the stress intensity factor (K) and crack propagation direction (${ heta}_0$) at the crack-tip that is associated with delamination in the large scale integration(LSI) package. To establish a reasonable strength evaluation method and life prediction, it is necessary to assess fracture parameters under various fracture conditions. Therefore, we conducted quantitative stress singularity analysis considering thermal stress simulating the changes of crack length (a), (h) and (v) in delamination using the 2-dimensional elastic boundary element method (BEM), and from these results predicted crack propagation direction and path.