We proposed a new method to improve the resolution of far object image in curving effective integral imaging system. Basically, the curving effective integral imaging(CEII) system can improve the resolution of the reconstructed images with an increased sampling rate of elemental images. However, in the case when an object located far from the lenslet array is picked up, the low resolution of the reconstructed images of the far object has been a primary problem because the sampling rate is very low. In order to solve this drawback, by using the direct pixel mapping(DPM) method the EIA picked up from a far object is transformed into a new EIA that virtually looks like the EIA picked up from the object originally located close to the lenslet array. From this new EIA, highly resolution-enhanced images of far object could be reconstructed in the CEII system. To show the feasibility of the proposed method, simulation results are compared with the conventional method.