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Fatigue life prediction of multiple site damage based on probabilistic equivalent initial flaw model
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  • Fatigue life prediction of multiple site damage based on probabilistic equivalent initial flaw model
  • Fatigue life prediction of multiple site damage based on probabilistic equivalent initial flaw model
저자명
Kim. JungHoon,Zi. Goangseup,Van. Son-Nguyen,Jeong. MinChul,Kong. JungSik,Kim. Minsung
간행물명
Structural engineering and mechanics : An international journal
권/호정보
2011년|38권 4호|pp.443-457 (15 pages)
발행정보
테크노프레스
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

The loss of strength in a structure as a result of cyclic loads over a period of life time is an important phenomenon for the life-cycle analysis. Service loads are accentuated at the areas of stress concentration, mainly at the connection of components. Structural components unavoidably are affected by defects such as surface scratches, surface roughness and weld defects of random sizes, which usually occur during the manufacturing and handling process. These defects are shown to have an important effect on the fatigue life of the structural components by promoting crack initiation sites. The value of equivalent initial flaw size (EIFS) is calculated by using the back extrapolation technique and the Paris law of fatigue crack growth from results of fatigue tests. We try to analyze the effect of EIFS distribution in a multiple site damage (MSD) specimen by using the extended finite element method (XFEM). For the analysis, fatigue tests were conducted on the centrally-cracked specimens and MSD specimens.