Certified reference materials (CRMs) have been used to calibrate surface profilers for reliable measurements. In this paper, we present a newly designed step height CRM which has a step height pattern with two different widths and various special patterns for checking radial magnification, distortion of optical viewing systems, etc. Especially, it could be useful for multi-probe inspection instruments in the manufacturing lines. The fabrication was done by conventional optical lithography and dry etching process with optimized conditions. To verify the step height values, a white-light scanning interferometer was used with objective lenses having magnification of $10{ imes}$ and $100{ imes}$. CRMs with nominal step heights of $0.5;{mu}m$, $1;{mu}m$, $3;{mu}m$, $5;{mu}m$, $7;{mu}m$, and $10;{mu}m$ were fabricated and the uniformity of these CRMs was evaluated to be less than 3 nm ($1{sigma}$).