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Discharging/Charging Voltage-Temperature Pattern Recognition for Improved SOC/Capacity Estimation and SOH Prediction at Various Temperatures
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  • Discharging/Charging Voltage-Temperature Pattern Recognition for Improved SOC/Capacity Estimation and SOH Prediction at Various Temperatures
  • Discharging/Charging Voltage-Temperature Pattern Recognition for Improved SOC/Capacity Estimation and SOH Prediction at Various Temperatures
저자명
Kim. Jong-Hoon,Lee. Seong-Jun,Cho. Bo-Hyung
간행물명
Journal of power electronics : JPE
권/호정보
2012년|12권 1호|pp.1-9 (9 pages)
발행정보
전력전자학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

This study investigates an application of the Hamming network-dual extended Kalman filter (DEKF) based on pattern recognition for high accuracy state-of-charge (SOC)/capacity estimation and state-of-health (SOH) prediction at various temperatures. The averaged nine discharging/charging voltage-temperature (DCVT) patterns for ten fresh Li-Ion cells at experimental temperatures are measured as representative patterns, together with cell model parameters. Through statistical analysis, the Hamming network is applied to identify the representative pattern that matches most closely with the pattern of an arbitrary cell measured at any temperature. Based on temperature-checking process, model parameters for a representative DCVT pattern can then be applied to estimate SOC/capacity and to predict SOH of an arbitrary cell using the DEKF. This avoids the need for repeated parameter measuremet.