In computer vision, it is very important to obtain reliable corresponding feature points. However, we know it is not easy to find the corresponding feature points exactly considering by scaling, lighting, viewpoints, etc. Lots of SIFT methods applies the invariant to image scale and rotation and change in illumination, which is due to the feature vector extracted from corners or edges of object. However, SIFT could not find feature points, if edges do not exist in the area when we extract feature points along edges. In this paper, we present a new placement method of marker to improve the performance of SIFT feature detection and matching between different view of an object or scene. The shape of the markers used in the proposed method is formed in a semicircle to detect dominant direction vector by SIFT algorithm depending on direction placement of marker. We applied De Bruijn sequence for the markers direction placement to improve the matching performance. The experimental results show that the proposed method is more accurate and effective comparing to the current method.