This paper deals with the measurement theory and technique of linear expansion coefficient for solid material using Michelson interferometer. The Michelson interferometer produces interference fringes by splitting a beam of monochromatic light so that one beam strikes a fixed mirror and the other a movable mirror. When the reflected beams are brought back together, an interference pattern results. Precise distance measurements until a quarter of wave length can be made with the Michelson interferometer by moving the mirror and counting the interference fringes which move by a photo diode. This paper represents the application of Michelson interferometer for measuring infinitesimal length system and shows the measurement method of linear expansion coefficients for various materials like copper, aluminum and iron. the results are good agreement with theoretical value within margin of error for each materials.