TFT-LCD image includes a defect of various properties. TFT-LCD image have a recognizable defects in the human inspector. On the other hand, it is difficult to detect defects that difference between the background and defect is very low. In this paper, we proposed sequentially detect algorithm from pixels included in the defect region to limited defects. And blob analysis methods using the blob size and gray difference are applied to the defect candidate image. Finally, we detect an accurate defect blob to distinguish the noise. The experimental results show that the proposed method finds the various defects reliably.