Confocal reflection microscopy (CRM) was utilized to create 3-dimensional images of bordered pits and cell wall in the tracheid of Korean red pine (Pinus densiflora). Ultrastructures of torus, margo, and pit border were clearly observable in the CRM micrograph. Micrograph of cross-field pit revealed the connecting and supporting structure between tracheid and ray parenchyma cell. The CRM micrographs enabled to investigate detailed structures of tracheid cell wall such as S1, S2, S3 layers, transition layers between these layers, and microfibril (MF) orientation in S3 and S2 layers as well as complicated distribution of MF orientation around bordered pits. Not only concentric MF orientation of border thickening in the pit border was observed, but also changes in MF orientation from the cell wall to the border. From the experimental results, the CRM was thought to be a versatile microtechnique to investigate detailed structures of cell wall and bordered pit in the tracheid and cross-field pit between tracheid and ray parenchyma cell.