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An Adaptively Segmented Forward Problem Based Non-Blind Deconvolution Technique for Analyzing SRAM Margin Variation Effects
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  • An Adaptively Segmented Forward Problem Based Non-Blind Deconvolution Technique for Analyzing SRAM Margin Variation Effects
  • An Adaptively Segmented Forward Problem Based Non-Blind Deconvolution Technique for Analyzing SRAM Margin Variation Effects
저자명
Somha. Worawit,Yamauchi. Hiroyuki
간행물명
Journal of semiconductor technology and science
권/호정보
2014년|14권 4호|pp.365-375 (11 pages)
발행정보
대한전자공학회
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정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

This paper proposes an abnormal V-shaped-error-free non-blind deconvolution technique featuring an adaptively segmented forward-problem based iterative deconvolution (ASDCN) process. Unlike the algebraic based inverse operations, this eliminates any operations of differential and division by zero to successfully circumvent the issue on the abnormal V-shaped error. This effectiveness has been demonstrated for the first time with applying to a real analysis for the effects of the Random Telegraph Noise (RTN) and/or Random Dopant Fluctuation (RDF) on the overall SRAM margin variations. It has been shown that the proposed ASDCN technique can reduce its relative errors of RTN deconvolution by $10^{13}$ to $10^{15}$ fold, which are good enough for avoiding the abnormal ringing errors in the RTN deconvolution process. This enables to suppress the cdf error of the convolution of the RTN with the RDF (i.e., fail-bit-count error) to $1/10^{10}$ error for the conventional algorithm.