Printed electronics devices are made of several sets of printed patterns. The quality or printability of the printed patterns determines the electrical performance of such devices. Moreover, control of the printability determines the reliability of such devices. Despite its importance, few studies have been reported for the measurement of the printed patterns to evaluate their printability. In this study, a measurement method is proposed for printed patterns, including the definition of the properties to be measured, and the related software is described. The proposed method measures the width, pinholes, and edge waviness and evaluates the printability of the patterns quantitatively. The proposed measurement method could be an efficient tool to evaluate and enhance the printability of printed patterns in printed electronics.