- 전자장치용 Passivation 유리의 결정화에 관한 연구
- ㆍ 저자명
- 손명모,박희찬,이헌수
- ㆍ 간행물명
- 요업학회지
- ㆍ 권/호정보
- 1993년|30권 2호|pp.107-114 (8 pages)
- ㆍ 발행정보
- 한국세라믹학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
Zinc-Borosilicate(ZnO 65.0wt%, B2O3 21.5wt%, SiO2 9.0wt%, PbO or tiO2 4wt%) passivation glasses were studied using differential thermal analysis(DTA), scanning electron microscopy(SEM) observations, X-ray diffraction (XRD) patterns and measurement of thermal expansion coefficients. Passivation glasses containing 4wt% TiO2 and 4wt% PbO had crystallization temperature of 680~73$0^{circ}C$ and major crystalline phases were identified by X-ray diffraction as $alpha$-ZnO.B2O3 and $alpha$-5ZnO.2B2O3. As increasing firing temperature, the size of crystalline phases increased by observation of SEM. The thermal expansion coefficient of crystallized glass frits was smaller than that of unfired glass.