This paper develops a new VSI $={X}-CRL$ synthetic control chart that considers convenience of use in the field, and perception of change of process applying VSI techniques to synthetic control chart, simultaneously. We found the optimal sampling interval and various control limit factor of the suggested chart using markov chain. Comparison and analysis is carried out between synthetic VSI $={X}-CRL$ chart and other chart in the statistical aspect; $={X}$ control chart, VSI $={X}$ chart, another synthetic chart. In case that the process follows normal distribution, the proposed VSI $={X}-CRL$ synthetic control chart in detecting process mean shift showed the best performance in aspect of statistical performance, regardless of control limit L of CRL/S control chart.