- 전기장에 의한 Bi12GeO20 단결정의 굴절률 표시타원체의 변형
- ㆍ 저자명
- 이수대,이찬구,Lee. Su-Dae,Lee. Chan-Ku
- ㆍ 간행물명
- 전기전자재료학회논문지
- ㆍ 권/호정보
- 2005년|18권 1호|pp.89-95 (7 pages)
- ㆍ 발행정보
- 한국전기전자재료학회
- ㆍ 파일정보
- 정기간행물| PDF텍스트
- ㆍ 주제분야
- 기타
We derived a formula which can calculate the space distribution of refractive index variation by an applied electric field about Bi$_{12}$ GeO$_{20}$ single crystal. Stereographic projection maps of refractive index variation by an applied electric field were made out using numerical value to be calculated by this formula. By the calculated results, since an electric field had applied to [(equation omitted) 1 1] direction and [1 (equation omitted) 1] direction of Bi$_{12}$ GeO$_{20}$ crystal, positive variation of the refractive index of [(equation omitted) 1 1] direction and [1 (equation omitted) 1] direction was the largest. The incremented refractive index per unit electric field was +3.2410${ imes}$10$^{-11}$ V$^{-1}$ for the wavelength of 6328 $AA$. Since an electric field had applied to [1 1 1] direction and [(equation omitted) 1] direction, negative variation of the refractive index of [1 1 1] direction and [(equation omitted) 1] direction was the largest. The decremented refractive index per unit electric field was -3.2410${ imes}$10$^{-11}$ V$^{-1}$ for the wavelength of 6328 $AA$.