The main principle of two widely used methods which were proposed by Ruan and Bhushan, and by Ogletree and Carpick are introduced. Experiments were conducted using the two methods to measure friction force between AFM probe and silicon sample quantitatively. To characterize the frictional properties, the conversion factors of the two methods by which lateral electronic signal is converted into actual friction force were calculated. The experimental results show that that the conversion factors were extraordinarily different from each other. Further research should be done to identity the reasons for these differences.