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Formation of $Y_{2}O_{3}$ nanodots on substrate surface using the rf-sputtering method
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  • Formation of $Y_{2}O_{3}$ nanodots on substrate surface using the rf-sputtering method
  • Formation of $Y_{2}O_{3}$ nanodots on substrate surface using the rf-sputtering method
저자명
Chang. K.C.,Yoo. J.M.,Kim. Y.K.,Wang. X.L.,Dou. S.X.
간행물명
한국초전도·저온공학회논문지
권/호정보
2008년|10권 4호|pp.6-8 (3 pages)
발행정보
한국초전도저온공학회
파일정보
정기간행물|ENG|
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이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

$Y_{2}O_{3}$ nanodots have been deposited on top of the substrate surface using rf-sputtering method. This approach was adopted to be able to modulate the substrate surface with nanodots used as a seed for the flux pinning sites in the superconducting films. The nanodot density of $Y_{2}O_{3}$ was controlled mainly using the deposition time, rf-power, and substrate temperature. $Y_{2}O_{3}$ nanodots with ${sim};50;nm$ in diameter and ${sim};3;nm$ in height were obtained at rf-sputtering time of about 15 seconds using 400 watts of rf-power and $630^{circ}C$ of substrate temperature. As deposition time increased up to about 30 seconds, the interconnected islands of $Y_{2}O_{3}$ nanodots formed, which can be clearly observed with AFM surface image. The substrate surface was covered entirely with $Y_{2}O_{3}$ layer above the deposition time of 60 seconds. The modulated surface morphologies and cross section analysis of deposited $Y_{2}O_{3}$ nanodots at various experimental conditions have been examined using AFM and discussed with respect to the flux pinning sites for the practical application.