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Temperature Distribution in Polishing Pad during CMP Process: Effect of Retaining Ring
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  • Temperature Distribution in Polishing Pad during CMP Process: Effect of Retaining Ring
  • Temperature Distribution in Polishing Pad during CMP Process: Effect of Retaining Ring
저자명
Lee. Hyun-Seop,Guo. Yong-Chang,Jeong. Hae-Do
간행물명
International journal of precision engineering and manufacturing
권/호정보
2012년|13권 1호|pp.25-31 (7 pages)
발행정보
한국정밀공학회
파일정보
정기간행물|ENG|
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기타
이 논문은 한국과학기술정보연구원과 논문 연계를 통해 무료로 제공되는 원문입니다.
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기타언어초록

Heat generation is inevitable during the chemical mechanical planarization (CMP) process because the mechanical and chemical removal of material is carried out by using abrasives and chemicals in the CMP slurry. In this paper, results obtained from experiments performed on a membrane-type carrier having a retaining ring were used to study the temperature distribution in a polishing pad during the CMP process. To understand and predict the distribution of temperature rise, a kinematical analysis of the temperature distribution was performed by considering the frictional characteristics of the process. The results of this study can be used to predict the temperature distribution in a polishing pad, and such predictions can help in developing a more effective CMP process.